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[IEEE Fifty-First IEEE Holm Conference on Electrical Contacts, 2005. - Chicago, IL, USA (Sept. 26-28, 2005)] Proceedings of the Fifty-First IEEE Holm Conference on Electrical Contacts, 2005. - Displacement measurements at the connector contact interface employing a novel thick film sensor

✍ Scribed by Lam, L.; McBride, J.W.; Maul, C.; Atkinson, J.K.

Book ID: 126634571
Publisher: IEEE
Year: 2005
Weight: 581 KB
Category: Article
ISBN-13: 9780780391130
DOI: 10.1109/HOLM.2005.1518228

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