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[IEEE Factory Automation (ETFA 2009) - Palma de Mallorca, Spain (2009.09.22-2009.09.25)] 2009 IEEE Conference on Emerging Technologies & Factory Automation - Automation component aspects for efficient unit testing

✍ Scribed by Winkler, Dietmar; Hametner, Reinhard; Biffl, Stefan

No coin nor oath required. For personal study only.

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