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[IEEE ESSDERC 2007 - 37th European Solid State Device Research Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSDERC 2007 - 37th European Solid State Device Research Conference - Threshold voltage in tunnel FETs: physical definition, extraction, scaling and impact on IC design

✍ Scribed by Boucart, Kathy; Ionescu, Adrian M.

Book ID: 121234902
Publisher: IEEE
Year: 2007
Weight: 305 KB
Category: Article
ISBN: 1424411238
DOI: 10.1109/ESSDERC.2007.4430937

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