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[IEEE ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Impact of stress on various circuit characteristics in 65nm PDSOI technology

✍ Scribed by Suryagandh, Sushant; Gupta, Mayank; Zhi-Yuan Wu, ; Krishnan, Srinath; Pelella, Mario; Jung-Suk Goo, ; Thuruthiyil, Ciby; Judy X. An, ; Chen, Brian Q.; Subba, Niraj; Zamudio, Luis; Yonemura, James; Icel, Ali B.

Book ID: 126620260
Publisher: IEEE
Year: 2007
Weight: 208 KB
Category: Article
ISBN: 1424411254
DOI: 10.1109/ESSCIRC.2007.4430260

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