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[IEEE Electrical/Electronics Insulation Conference - Chicago, IL, USA (4-7 Oct. 1993)] Proceedings of Electrical/Electronics Insulation Conference - An optical technique to detect the degradation of electrical insulation

✍ Scribed by Bamji, S.S.; Bulinski, A.T.; Shen, J.

Book ID: 121291947
Publisher: IEEE
Year: 1993
Weight: 441 KB
Category: Article
ISBN-13: 9780780308473
DOI: 10.1109/EEIC.1993.631303

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