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[IEEE Electrical Contacts - 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on Electrical Contacts - Chicago, IL, USA (25-27 Sept. 2000)] Electrical Contacts - 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on Electrical Contacts (Cat. No.00CB37081) - Test and analysis of reliability for electromagnetic relay

✍ Scribed by Kui Li, ; Fang Yao, ; Jianguo Lu, ; Zhigang Li,

Book ID: 121337916
Publisher: IEEE
Year: 2000
Weight: 426 KB
Edition: 2000
Category: Article
ISBN-13: 9780780359604
DOI: 10.1109/HOLM.2000.889915

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