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[IEEE Eighth IEEE International Symposium on High Assurance Systems Engineering, 2004. - Tampa, FL, USA (25-26 March 2004)] Eighth IEEE International Symposium on High Assurance Systems Engineering, 2004. Proceedings. - Assessing reliability risk using fault correction profiles

✍ Scribed by Schneidewind, N.F.

Book ID: 126695072
Publisher: IEEE
Year: 2004
Weight: 263 KB
Category: Article
ISBN-13: 9780769520940
DOI: 10.1109/HASE.2004.1281738

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