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[IEEE Eighteenth Convention of Electrical and Electronics Engineers in Israel - Tel Aviv, Israel (7-8 March 1995)] Eighteenth Convention of Electrical and Electronics Engineers in Israel - A generation system reliability model with Monte Carlo simulation

✍ Scribed by Bianu, A.; Frant, S.; Gurevich, V.

Book ID: 115530525
Publisher: IEEE
Year: 1995
Weight: 335 KB
Volume: 0
Category: Article
ISBN-13: 9780780324985
DOI: 10.1109/eeis.1995.513817

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