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[IEEE Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. 2002 - San Jose, CA, USA (12-14 March 2002)] Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings 2002 (Cat.No.02CH37311) - A simplified method of generating thermal models for power MOSFETs

✍ Scribed by Pandya, K.L.; McDaniel, W.

Book ID: 120894356
Publisher: IEEE
Year: 2002
Weight: 781 KB
Category: Article
ISBN-13: 9780780373273
DOI: 10.1109/STHERM.2002.991350

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