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[IEEE Digests of the 2010 14th Biennial IEEE Conference on Electromagnetic Field Computation - Chicago, IL, USA (2010.05.9-2010.05.12)] Digests of the 2010 14th Biennial IEEE Conference on Electromagnetic Field Computation - Comparison of two methods for modeling thin regions in eddy current non-destructive testing

โœ Scribed by Ospina, A.; Zaidi, H.; Santandrea, L.; Krebs, G.; Le Bihan, Y.


Book ID
120062478
Publisher
IEEE
Year
2010
Weight
290 KB
Category
Article
ISBN
1424470595

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