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[IEEE Digests of the 2010 14th Biennial IEEE Conference on Electromagnetic Field Computation - Chicago, IL, USA (2010.05.9-2010.05.12)] Digests of the 2010 14th Biennial IEEE Conference on Electromagnetic Field Computation - Measurement and calculation of iron loss inside silicon steel lamination under DC biasing

✍ Scribed by Zhigang Zhao, ; Fugui Liu, ; Cheng, Z.; Liu, L.; Zhang, J.; Fan, Y.; Weili Yan,

Book ID: 120050924
Publisher: IEEE
Year: 2010
Weight: 349 KB
Category: Article
ISBN: 1424470595
DOI: 10.1109/CEFC.2010.5481506

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