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[IEEE Digests of the 2010 14th Biennial IEEE Conference on Electromagnetic Field Computation - Chicago, IL, USA (2010.05.9-2010.05.12)] Digests of the 2010 14th Biennial IEEE Conference on Electromagnetic Field Computation - Electromagnetic inspection technique of thickness of nickel-layer on steel plate without influence of lift-off between steel and inspection probe

✍ Scribed by Gotoh, Y.; Matsuoka, A.; Takahashi, N.

Book ID: 120040952
Publisher: IEEE
Year: 2010
Weight: 99 KB
Category: Article
ISBN: 1424470595
DOI: 10.1109/CEFC.2010.5481872

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