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[IEEE Device Research Conference. Conference Digest - Notre Dame, IN, USA (25-27 June 2001)] Device Research Conference. Conference Digest (Cat. No.01TH8561) - Linearity of high Al-content AlGaN/GaN HEMTs

โœ Scribed by Jenkins, T.; Kehias, L.; Parikh, P.; Wu, Y.-F.; Chavarkar, P.; Moore, M.; Mishra, U.


Book ID
120564753
Publisher
IEEE
Year
2001
Weight
170 KB
Category
Article
ISBN-13
9780780370142

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