[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Test Cost Reduction for SoC Using a Combined Approach to Test Data Compression and Test Scheduling

[IEEE Design, Automation & Test in Europ

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[IEEE Design, Automation & Test in Europ

✍ Huang, Yu 📂 Article 📅 2007 🏛 IEEE ⚖ 397 KB

[IEEE Design, Automation & Test in Europ

✍ Jerraya, Ahmed Amine 📂 Article 📅 2007 🏛 IEEE 🌐 German ⚖ 96 KB

[IEEE Design, Automation & Test in Europ

✍ Narayanan, Ramanathan (author);Honbo, Daniel (author);Memik, Gokhan (author);Cho 📂 Article 📅 2007 🏛 IEEE ⚖ 109 KB

[IEEE Design, Automation & Test in Europ

✍ Narayanan, Ramanathan (author);Honbo, Daniel (author);Memik, Gokhan (author);Cho 📂 Article 📅 2007 🏛 IEEE ⚖ 109 KB

[IEEE Design, Automation & Test in Europ

✍ Alam, Monjur; Ray, Sonai; Mukhopadhayay, Debdeep; Ghosh, Santosh; RoyChowdhury, 📂 Article 📅 2007 🏛 IEEE 🌐 German ⚖ 140 KB