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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Area and Throughput Trade-Offs in the Design of Pipelined Discrete Wavelet Transform Architectures

✍ Scribed by Silva, S.V.; Bampi, S.

Book ID: 125815844
Publisher: IEEE
Year: 2005
Weight: 208 KB
Category: Article
DOI: 10.1109/DATE.2005.66

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