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[IEEE CPEM 2000 - Sydney, NSW, Australia (14-19 May 2000)] Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031) - High value resistance standards at ETL

✍ Scribed by Kinoshita, J.; Nakanishi, M.

Book ID: 120210389
Publisher: IEEE
Year: 2000
Weight: 171 KB
Edition: 1
Category: Article
ISBN-13: 9780780357440
DOI: 10.1109/CPEM.2000.850992

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