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[IEEE Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997 - Anaheim, CA, USA (29 Sept.-3 Oct. 1997)] Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997 - Modeling the growth of PECVD silicon nitride films for crystalline silicon solar cells using factorial design and response surface methodology

✍ Scribed by Nybergh, K.; Marjamaki, T.; Skarp, E.

Book ID: 121731654
Publisher: IEEE
Year: 1997
Weight: 324 KB
Edition: 1997
Category: Article
ISBN-13: 9780780337671
DOI: 10.1109/PVSC.1997.654049

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