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[IEEE Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997 - Anaheim, CA, USA (29 Sept.-3 Oct. 1997)] Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997 - Study of the defect levels, electrooptics, and interface properties of polycrystalline CdTe and CdS thin films and their junction [solar cells]

✍ Scribed by Abulfotuh, F.A.; Balcioglu, A.; Wangensteen, T.; Moutinho, H.R.; Hassoon, F.; Al-Douri, A.; Alnajjar, A.; Kazmerski, L.L.

Book ID: 120820003
Publisher: IEEE
Year: 1997
Weight: 358 KB
Edition: 1997
Category: Article
ISBN-13: 9780780337671
DOI: 10.1109/PVSC.1997.654125

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