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[IEEE Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference 2002 - New Orleans, LA, USA (19-24 May 2002)] Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. - Fixed charge density in silicon nitride films on crystalline silicon surfaces under illumination

✍ Scribed by Dauwe, S.; Schmidt, J.; Metz, A.; Hezel, R.

Book ID: 117993839
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 299 KB
Edition: 1
Volume: 0
Category: Article
ISBN-13: 9780780374713
DOI: 10.1109/pvsc.2002.1190481

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