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[IEEE Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference - Lake buena Vista, FL, USA (3-7 Jan. 2005)] Conference Record of the Thirty-first IEEE Photovoltaic Specialists Conference, 2005. - Determination of thermophysical properties of thin films for photovoltaic applications

✍ Scribed by Wolf, A.; Pohl, P.; Brendel, R.

Book ID: 118022569
Publisher: IEEE
Year: 2005
Weight: 669 KB
Volume: 0
Category: Article
ISBN-13: 9780780387072
DOI: 10.1109/pvsc.2005.1488488

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