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[IEEE Conference Record of the IEEE Industry Applications Society Annual Meeting - San Diego, CA, USA (1-5 Oct. 1989)] Conference Record of the IEEE Industry Applications Society Annual Meeting - Development of a second breakdown model for bipolar transistors

✍ Scribed by Menhart, S.; Portnoy, W.M.

Book ID: 126846786
Publisher: IEEE
Year: 1989
Weight: 549 KB
Category: Article
DOI: 10.1109/ias.1989.96802

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