[IEEE Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting - Tampa, FL (2006.10.8-2006.10.8)] Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting - Power MOSFET Switching Loss Analysis: A New Insight

[IEEE Conference Record of the 2006 IEEE

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[IEEE Conference Record of the 2006 IEEE

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[IEEE Conference Record of the 2006 IEEE

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[IEEE Conference Record of the 2006 IEEE

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[IEEE Conference Record of the 2006 IEEE

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[IEEE Conference Record of the 2006 IEEE

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