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[IEEE Conference Record of the 2004 IEEE Industry Applications Conference, 2004. 39th IAS Annual Meeting. - Seattle, WA, USA (3-7 Oct. 2004)] Conference Record of the 2004 IEEE Industry Applications Conference, 2004. 39th IAS Annual Meeting. - Evaluating conduction loss of a parallel IGBT-MOSFET combination

โœ Scribed by Kimball, J.W.; Chapman, P.L.


Book ID
111978186
Publisher
IEEE
Year
2004
Tongue
English
Weight
356 KB
Volume
2
Category
Article
ISBN-13
9780780384866

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[IEEE Conference Record of the 2004 IEEE