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[IEEE Conference Record of the 1998 IEEE International Symposium on Electrical Insulation - Arlington, VA, USA (7-10 June 1998)] Conference Record of the 1998 IEEE International Symposium on Electrical Insulation (Cat. No.98CH36239) - Effects of aging on dielectric interfaces of cable accessories

✍ Scribed by Chinh Dang,

Book ID: 120215499
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 472 KB
Volume: 2
Category: Article
ISBN-13: 9780780349278
DOI: 10.1109/ELINSL.1998.694853

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