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[IEEE Conference Record of the 1996 IEEE International Symposium on Electrical Insulation - Montreal, Que., Canada (16-19 June 1996)] Conference Record of the 1996 IEEE International Symposium on Electrical Insulation - Locating transformer faults through sensitivity analysis of high frequency modeling using transfer function approach

✍ Scribed by Islam, S.M.; Ledwich, G.

Book ID: 120861264
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 385 KB
Volume: 1
Category: Article
ISBN-13: 9780780335318
DOI: 10.1109/ELINSL.1996.549278

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