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[IEEE Conference Record of the 1992 IEEE International Symposium on Electrical Insulation - Baltimore, MD, USA (7-10 June 1992)] Conference Record of the 1992 IEEE International Symposium on Electrical Insulation - Influence of interfacial phenomena on conduction and breakdown in a thin dielectric liquid layer

โœ Scribed by Brosseau, C.


Book ID
126603534
Publisher
IEEE
Year
1992
Weight
445 KB
Category
Article
ISBN-13
9780780306493

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