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[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Active-Mode Leakage Reduction with Data-Retained Power Gating

✍ Scribed by Kahng, Andrew B.; Kang, Seokhyeong; Park, Bongil

Book ID: 125841781
Publisher: IEEE Conference Publications
Year: 2013
Weight: 447 KB
Category: Article
ISBN: 1467350710
DOI: 10.7873/DATE.2013.251

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