[IEEE Conference on Precision Electromagnetic Measurements - Ottawa, Ont., Canada (11-14 June 1990)] Conference on Precision Electromagnetic Measurements - An experiment in X-ray interferometry: accuracy and resolution in Si d/sub 220/ determination

✍ Scribed by Basile, G.; Bergamin, A.; Cavagnero, G.; Mana, G.; Vittone, E.; Zosi, G.

• Book ID: 111916200
• Publisher: IEEE
• Year: 1990
• Weight: 207 KB
• Volume: 0
• Category: Article
• DOI: 10.1109/cpem.1990.110014