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[IEEE Conference on Precision Electromagnetic Measurements - Ibaraki, Japan (1990.06.11-1990.06.14)] Conference on Precision Electromagnetic Measurements - Measurement Of The Complex Permittivity Of Microwave Materials With A Submillimeter Waveguide Four-Port Reflectometer

✍ Scribed by Stumper,

Book ID: 126753898
Publisher: IEEE
Year: 1988
Weight: 244 KB
Category: Article
DOI: 10.1109/CPEM.1988.671221

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