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[IEEE Conference on Precision Electromagnetic Measurements Digest - Boulder, CO, USA (27 June-1 July 1994)] Proceedings of Conference on Precision Electromagnetic Measurements Digest - Silicon lattice measurement with an X-ray/optical interferometer in a vacuum [Avogadro constant determination]

✍ Scribed by Nakayama, K.; Fujimoto, H.; Tanaka, M.; Misawa, G.

No coin nor oath required. For personal study only.

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