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[IEEE Conference on Optoelectronic and Microelectronic Materials and Devices - COMMAD'98 - Perth, WA, Australia (14-16 Dec. 1998)] 1998 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings (Cat. No.98EX140) - TEM measurement of Al profiles in interdiffused GaAs/AlGaAs quantum-wells

✍ Scribed by Zou, J.; Cai, D.Q.; Cockayne, D.J.H.; Yuan, S.; Jagadish, C.

Book ID: 126713758
Publisher: IEEE
Year: 1999
Weight: 269 KB
Category: Article
ISBN-13: 9780780345133
DOI: 10.1109/COMMAD.1998.791662

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