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[IEEE Conference on Electron Devices, 2005 Spanish - Tarragona, Spain (2-4 Feb. 2005)] Conference on Electron Devices, 2005 Spanish - Comparative evaluation of high current SiC schottky diodes and Si PN junction diodes

โœ Scribed by Jorda, X.; Tournier, D.; Vellvehi, M.; Perez, A.; Perez, R.; Godignon, P.; Millan, J.


Book ID
120050996
Publisher
IEEE
Year
2005
Weight
671 KB
Category
Article
ISBN-13
9780780388109

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