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[IEEE Conference on Electrical Insulation and Dielectric Phenomena - Austin, TX, USA (17-20 Oct. 1999)] 1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319) - Simulation of predischarge processes in SF/sub 6//N/sub 2/ mixtures stressed by very fast transient voltages

✍ Scribed by Pfeiffer, W.; Schoen, D.; Tong, L.Z.

Book ID: 127328903
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 392 KB
Edition: 1999
Category: Article
ISBN-13: 9780780354142
DOI: 10.1109/ceidp.1999.804670

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