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[IEEE Conference of Asia and South Pacific Design Automation 2003 - Kitakyushu, Japan (21-24 Jan. 2003)] Proceedings of the ASP-DAC Asia and South Pacific Design Automation Conference, 2003. - An automated method for test model generation from switch level circuits

✍ Scribed by McDougall, T.; Parashkevov, A.; Jolly, S.; Juhong Zhu, ; Jing Zeng, ; Pyron, C.; Abadir, M.

Book ID: 126599635
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 689 KB
Category: Article
ISBN-13: 9780780376595
DOI: 10.1109/ASPDAC.2003.1195123

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