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[IEEE Conference Digest [Late News Papers volume included]Device Research Conference, 2004. 62nd DRC. - Notre Dame, IN, USA (June 21-23, 2004)] Conference Digest [Late News Papers volume included]Device Research Conference, 2004. 62nd DRC. - Effect of gate recessing on linearity characteristics of AlGaN/GaN HEMTs

✍ Scribed by Chini, A.; Buttari, D.; Coffie, R.; Shen, L.; Palacios, T.; Heikman, S.; Chakraborty, A.; Keller, S.; Mishra, U.K.

Book ID: 125507342
Publisher: IEEE
Year: 2004
Weight: 148 KB
Category: Article
ISBN-13: 9780780382848
DOI: 10.1109/DRC.2004.1367770

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