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[IEEE Comput. Soc VLSI Design 2000. Thirteenth International Conference on VLSI Design - Calcutta, India (3-7 Jan. 2000)] VLSI Design 2000. Wireless and Digital Imaging in the Millennium. Proceedings of 13th International Conference on VLSI Design - Automatic validation test generation using extracted control models

✍ Scribed by Sumners, R.; Bhadra, J.; Abraham, J.

Book ID: 121258473
Publisher: IEEE Comput. Soc
Year: 2000
Tongue: English
Weight: 98 KB
Edition: 2000
Category: Article
ISBN-13: 9780769504872
DOI: 10.1109/ICVD.2000.812627

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