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[IEEE Comput. Soc Seventh Asian Test Symposium (ATS'98) - Singapore (2-4 Dec. 1998)] Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) - Diagnosis of single gate delay faults in combinational circuits using delay fault simulation

✍ Scribed by Takahashi, H.; Boateng, K.O.; Takamatsu, Y.

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