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[IEEE Comput. Soc. Press Sixth International Symposium on Software Reliability Engineering. ISSRE'95 - Toulouse, France (24-27 Oct. 1995)] Proceedings of Sixth International Symposium on Software Reliability Engineering. ISSRE'95 - Defect reduction in VSE-methodology and results

✍ Scribed by Buczilowski, H.

Book ID: 126647149
Publisher: IEEE Comput. Soc. Press
Year: 1995
Weight: 335 KB
Category: Article
ISBN-13: 9780818671319
DOI: 10.1109/ISSRE.1995.497667

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