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[IEEE Comput. Soc. Press Rensselaer's Second International Conference on Computer Integrated Manufacturing - Troy, NY, USA (21-23 May 1990)] [1990] Proceedings. Rensselaer's Second International Conference on Computer Integrated Manufacturing - Computer-based diagnostics for integrated manufacturing systems

✍ Scribed by Graham, J.H.; Alexander, S.M.

Book ID: 126748830
Publisher: IEEE Comput. Soc. Press
Year: 1990
Weight: 273 KB
Category: Article
ISBN-13: 9780818619663
DOI: 10.1109/CIM.1990.128108

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