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[IEEE Comput. Soc. Press Proceedings. IEEE International Symposium on Intelligent Control 1989 - Albany, NY, USA (25-26 Sept. 1989)] Proceedings. IEEE International Symposium on Intelligent Control 1989 - Monitoring manufacturing systems by means of Petri nets with imprecise markings

✍ Scribed by Valette, R.; Cardoso, J.; Dubois, D.

No coin nor oath required. For personal study only.

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