[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - A strategy for generating functional tests from device simulations

✍ Scribed by Merritt, C.

• Book ID: 111698133
• Publisher: IEEE Comput. Soc. Press
• Year: 1988
• Weight: 572 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780818608704
• DOI: 10.1109/test.1988.207758