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[IEEE Comput. Soc. Press IEEE VLSI Test Symposium - Cherry Hill, NJ, USA (25-28 April 1994)] Proceedings of IEEE VLSI Test Symposium - On compacting test sets by addition and removal of test vectors

✍ Scribed by Kajihara, S.; Pomeranz, I.; Kinoshita, K.; Reddy, S.M.

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