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[IEEE Comput. Soc. Press IEEE VLSI Test Symposium - Cherry Hill, NJ, USA (25-28 April 1994)] Proceedings of IEEE VLSI Test Symposium - Circuit-level dictionaries of CMOS bridging faults

✍ Scribed by Lee, T.; Chuang, W.; Hajj, I.N.; Fuchs, W.K.

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