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[IEEE Comput. Soc. Press IEEE International Conference on Computer Design: VLSI in Computers and Processors - Cambridge, MA, USA (14-16 Oct. 1991)] [1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors - Random testability of redundant circuits

✍ Scribed by Krasniewski, A.; Albicki, A.

Book ID: 126634582
Publisher: IEEE Comput. Soc. Press
Year: 1991
Weight: 401 KB
Category: Article
ISBN-13: 9780818622700
DOI: 10.1109/ICCD.1991.139936

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