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[IEEE Comput. Soc. Press IEEE Conference on Computer Vision and Pattern Recognition - San Francisco, CA, USA (18-20 June 1996)] Proceedings CVPR IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Constrained phase congruency: simultaneous detection of interest points and of their scales

✍ Scribed by Reisfeld, D.

Book ID: 125451496
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 673 KB
Category: Article
ISBN-13: 9780818672583
DOI: 10.1109/cvpr.1996.517128

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