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[IEEE Comput. Soc. Press Great Lakes Symposium on VLSI - Urbana-Champaign, IL, USA (13-15 March 1997)] Proceedings Great Lakes Symposium on VLSI - How an "evolving" fault model improves the behavioral test generation

โœ Scribed by Buonanno, G.; Ferrandi, F.; Ferrandi, L.; Fummi, F.; Sciuto, D.


Book ID
126762520
Publisher
IEEE Comput. Soc. Press
Year
1997
Weight
708 KB
Category
Article
ISBN-13
9780818679049

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