✦ LIBER ✦

[IEEE Comput. Soc. Press Fourth Asian Test Symposium - Bangalore, India (23-24 Nov. 1995)] Proceedings of the Fourth Asian Test Symposium - Power supply current detectability of SRAM defects

✍ Scribed by Jian Liu, ; Makki, R.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc. Press Fourth Asian Te

✍ Balakrishnan, A.; Chakradhar, S.T. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 830 KB

[IEEE Comput. Soc. Press Fourth Asian Te

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press ⚖ 726 KB

[IEEE Comput. Soc. Press Fourth Asian Te

✍ Voyiatzis, I.; Nikolos, D.; Paschalis, A.; Halatsis, C.; Haniotakis, T. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 719 KB

[IEEE Comput. Soc. Press Fourth Asian Te

✍ De, M.; Sinha, B.P. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 450 KB

[IEEE Comput. Soc. Press Fourth Asian Te

✍ Takahashi, H.; Yanagida, N.; Takamatsu, Y. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 802 KB

[IEEE Comput. Soc. Press Fourth Asian Te

✍ Lentz, K.P.; Manolakos, E.S.; Czeck, E.C. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 706 KB