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[IEEE Comput. Soc. Press First Great Lakes Symposium on VLSI - Kalamazoo, MI, USA (1-2 March 1991)] [1991] Proceedings. First Great Lakes Symposium on VLSI - Testability profile estimation of VLSI circuits from fault coverage

✍ Scribed by Farhat, H.A.; Saidian, H.

No coin nor oath required. For personal study only.

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