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[IEEE Comput. Soc. Press European Design and Test Conference EDAC-ETC-EUROASIC - Paris, France (28 Feb.-3 March 1994)] Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC - Application of simple genetic algorithms to sequential circuit test generation

✍ Scribed by Rudnick, E.M.; Holm, J.G.; Saab, D.G.; Patel, J.H.

Book ID: 121749072
Publisher: IEEE Comput. Soc. Press
Year: 1994
Tongue: English
Weight: 575 KB
Category: Article
ISBN-13: 9780818654107
DOI: 10.1109/EDTC.1994.326901

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