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[IEEE Comput. Soc. Press European Design and Test Conference EDAC-ETC-EUROASIC - Paris, France (28 Feb.-3 March 1994)] Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC - A new BIST approach for delay fault testing

✍ Scribed by Vuksic, A.; Fuchs, K.

Book ID: 118221328
Publisher: IEEE Comput. Soc. Press
Year: 1994
Tongue: English
Weight: 422 KB
Volume: 0
Category: Article
ISBN-13: 9780818654107
DOI: 10.1109/edtc.1994.326863

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